The XGT X-ray Fluorescence micro-analyzers combine the fast, non-destructive elemental analysis of energy dispersive X-ray Fluorescence (EDXRF) with the capability to pinpoint individual particles with diameters down to 10 µm in size. Automated sample scanning provides detailed images of elemental distribution, over areas as large as 10cm x 10cm.
No other technique provides this depth of information with so little fuss. Simply position the sample, and the measurement can begin. Optical and elemental views are seamlessly merged, with the fastest possible acquisition times.
FEATURES
Simple analysis operation with no preparation required and non-destructive analysis.
Measurement points can be accessed quickly through high-precision optical observation, even in the microscopic range.
Clear and High-speed Image Mapping.
Clear Optical Image Observation and Coaxial X-ray Irradiation.
Employing of imaging technology based on Raman imaging technique.
The XGT-9000 Series can detect and determine the composition of foreign particles, and therefore track the source of contamination. The particle detection function within the XGT-9000 Series makes it possible to count the number of particles, characterize particle sizes, and get the coordinate position of particles to re-analyze them in detail.